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Kyoto University Microstructural Characterization Platform Shared Equipment
Shared Equipment 1
Ultralow-temperature high-resolution transmission electron microscope /
JEOL JEM-2100F(G5)
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- Resolution
- 0.2 nm
- Acceleration voltage
- 200 kV
- Helium stage
- He holding time：4 hours
- Electron Gun
- ZrO/W(100)FEG
- CCD camera
- 2048x2048 pixel
- Characteristics
- Sample temperature is held at liquid He temperature during the observation. This cryo-TEM has "cryo-transfer system" so that sample can be inserted into sample stage without exposure to air after quick quenching.
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Shared Equipment 2
Spherical-aberration-corrected transmission electron microscope / JEOL
JEM-2200FS + CETCOR
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- Resolution
- 0.1 nm (Cs-corrected)
- Acceleration voltage
- 200 kV
- Electron spectrometer
- Ω-type filter / Energy resolution 0.8 eV
- Electron gun
- ZrO/W(100) Schottky-type
- CCD camera
- 2048x2048 pixel
- Cs corrector
- CEOS CETCOR Cs corrector (TEM mode)
- Characteristics
- It can be used as both of TEM and STEM. It is an analytical TEM for general
purpose with sample heating holder, low temperature holder and so on.
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Shared Equipment 3
Monochromated atomic resolution analytical electron microscope / JEOL JEM-ARM200F
+ Double Wien filter + CETCOR and CESCOR
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- Acceleration voltage
- 200 kV, 60 kV
- Monochrometer
- Double Wien filter
- Cs corrector
- CEOS CETCOR + CESCOR
- Energy filter
- Gatan 966 QuantumERS
- EDX
- JED-2300T SDD100GV (JEOL)
- Characteristics
- It can carry out elemental mapping by using EDX at atomic resolution and EELS measurement at high energy resolution.
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Shared Equipment 4
Focused ion beam machining apparatus / JEOL JEM-9310FIB
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- Ga ion source
- 5～30ｋV
- Sample stage
- TEM holder stage・Bulk sample stage
- Max current
- 10 nA
- Resolution
- 8nm
- Characteristics
- FIB is an apparatus for cutting and thinning of comparatively hard EM samples
like ceramics and metals by Ga ion beam sputtering.
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Shared Equipment 5
Microtome apparatus / Leica ULTRACUT UCT
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- Stage
- Cryo-stage(room temperature～liquid nitrogen temperature)、room temperature
- Characteristics
- Microtome is an apparatus for cutting and thinning of comparatively soft EM samples like organic materials by diamond knife.
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Shared Equipment 6
Precise ion milling apparatus / Gatan Model 691/PIPS
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- Ar ion gun
- 0.1～5 kV（2 modes）
- Sample stage
- Low temperature stage（room temperature～liquid nitrogen temperature）
- Characteristics
- This apparatus is used for the final fine polishing of the surfaces of
the samples prepared by FIB and dimpling machine by Ar ion beam sputtering.
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Shared Equipment 7
Dimpling apparatus / South Bay Technology D500i
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- Characteristics
- This apparatus is used for the thinning of comparatively hard materials by dimpling after polishing with diamond paste.
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